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author:

Chen, L. (Chen, L..) [1] | Xu, Q. (Xu, Q..) [2] | Xie, N. (Xie, N..) [3] | Tan, Q. (Tan, Q..) [4]

Indexed by:

Scopus PKU CSCD

Abstract:

The accuracy and stability of the optical voltage transformer (OVT), which is based on longitudinal modulation Pockels effect, are greatly affected by the uniformity of the electric field distribution in the crystals. Through an electric field simulation analysis of the multisegmented longitudinal modulation Pockels effect OVT, it is known that the electric field distribution in the BGO crystal is not uniform. When the position of crystal and the angle of incident light have a small deviation, the integral voltage error of the optical path in crystal is in general approaching or greater than 0.2%. To improve the electric field distribution in the crystal, a new method of quartz medium stratification is presented for the multisegmented longitudinal modulation Pockels effect OVT, and its effectiveness is verified by the finite element software ANSYS Maxwell and experiment. On the premise of ensuring the measuring sensitivity and an increase of the half wave voltage, the electric field integral error can be reduced to less than 0.05% that meets the requirement of 0.2%. © 2017 Automation of Electric Power Systems Press.

Keyword:

Electric-field distribution; Finite element analysis; Measurement error; Optical voltage transformer (OVT)

Community:

  • [ 1 ] [Chen, L.]College of Electric Engineering and Automation, Fuzhou University, Fuzhou, 350116, China
  • [ 2 ] [Xu, Q.]College of Electric Engineering and Automation, Fuzhou University, Fuzhou, 350116, China
  • [ 3 ] [Xie, N.]College of Electric Engineering and Automation, Fuzhou University, Fuzhou, 350116, China
  • [ 4 ] [Tan, Q.]College of Electric Engineering and Automation, Fuzhou University, Fuzhou, 350116, China

Reprint 's Address:

  • [Xu, Q.]College of Electric Engineering and Automation, Fuzhou UniversityChina

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Source :

Automation of Electric Power Systems

ISSN: 1000-1026

Year: 2017

Issue: 4

Volume: 41

Page: 158-162

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 9

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 4

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