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author:

Zhong, J. (Zhong, J..) [1] | Zhong, S. (Zhong, S..) [2] | Zhang, Q. (Zhang, Q..) [3] | Yao, L. (Yao, L..) [4]

Indexed by:

Scopus

Abstract:

We present a two-dimensional optical coherence vibration tomography (2DOCVT) system with an ultra-precision displacement resolution of ~0.1 nm that is capable of in site real-time absolute displacement measurement of structural line vibrations. Experimental results of sinusoidal, sweep and impulse vibrations were reported. The key figures of merit such as the 2DOCVT system could obtain fast line vibration measurement without scanning and it also could be used to capture structural modal parameters in one single impulse excitation measurement without any vibration excitation input information, making it attractive for the application in low-frequency vibration measurement and response-only modal analysis. © 2014 Elsevier Ltd.

Keyword:

Two-dimensional optical coherence tomography Absolute displacement measurement Response-only modal analysis

Community:

  • [ 1 ] [Zhong, J.]Laboratory of Optics, Terahertz and Non-destructive Testing, School of Mechanical Engineering and Automation, Fuzhou University, Fuzhou, 350108, China
  • [ 2 ] [Zhong, S.]Laboratory of Optics, Terahertz and Non-destructive Testing, School of Mechanical Engineering and Automation, Fuzhou University, Fuzhou, 350108, China
  • [ 3 ] [Zhong, S.]Fujian Key Laboratory of Medical Instrument and Pharmaceutical Technology, Fuzhou, 350108, China
  • [ 4 ] [Zhang, Q.]Laboratory of Optics, Terahertz and Non-destructive Testing, School of Mechanical Engineering and Automation, Fuzhou University, Fuzhou, 350108, China
  • [ 5 ] [Yao, L.]Laboratory of Optics, Terahertz and Non-destructive Testing, School of Mechanical Engineering and Automation, Fuzhou University, Fuzhou, 350108, China

Reprint 's Address:

  • [Zhong, S.]Laboratory of Optics, Terahertz and Non-destructive Testing, School of Mechanical Engineering and Automation, Fuzhou UniversityChina

Email:

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Source :

Optics and Lasers in Engineering

ISSN: 0143-8166

Year: 2015

Volume: 66

Page: 74-79

2 . 3 1 9

JCR@2015

3 . 5 0 0

JCR@2023

ESI HC Threshold:183

JCR Journal Grade:2

CAS Journal Grade:3

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 21

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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