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author:

Lin, F. (Lin, F..) [1] | Lin, H. (Lin, H..) [2] | Liao, F.-W. (Liao, F.-W..) [3] | Wen, B.-Y. (Wen, B.-Y..) [4]

Indexed by:

Scopus PKU CSCD

Abstract:

Microtopography is an important and complicated factor of affecting lightning strike trip-out. The rule of how microtopography affects lightning strike to the transmission line is explored based on geographic information systems(GIS) and Excel. How to form the files of transmission line and lightning strike information by using GIS is introduced. Combined with the microtopography of GIS, lightning strike data collected from the electric power company are analyzed. The correlation rules between exposed surface and fault phases of 110, 220 and 500 kV transmission lines caused by lightning strike are obtained. And some characteristics of lightning selectivity affected by microtopography factors including peak, river, valley, mountain ridge, windward slope and so on are explored. The results show that this statistic analysis method is very intuitive and imaginal. And the results can provide references for the path design of transmission line and the selection of lightning protection measures.

Keyword:

GIS; Keyhole markup language; Lightning; Lightning selectivity; Microtopography; Statistic analysis; Transmission line

Community:

  • [ 1 ] [Lin, F.]Technology Center of Fujian Electric Power Company, Limited, Fuzhou 350007, China
  • [ 2 ] [Lin, F.]Electrical Engineering and Automation College, Fuzhou University, Minhou 350108, China
  • [ 3 ] [Lin, H.]Fujian Electric Power Company, Limited, Fuzhou 350003, China
  • [ 4 ] [Liao, F.-W.]Fujian Electric Power Test and Research Institute, Fuzhou 350007, China
  • [ 5 ] [Wen, B.-Y.]Electrical Engineering and Automation College, Fuzhou University, Minhou 350108, China

Reprint 's Address:

  • [Lin, F.]Technology Center of Fujian Electric Power Company, Limited, Fuzhou 350007, China

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Source :

High Voltage Engineering

ISSN: 1003-6520

Year: 2009

Issue: 6

Volume: 35

Page: 1362-1369

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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