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author:

Yan, R.-W. (Yan, R.-W..) [1] | Cai, J.-D. (Cai, J.-D..) [2]

Indexed by:

Scopus

Abstract:

This paper presents a novel method of applying auto-regressive (AR) model and random forests to fault diagnosis of power electronic circuit. AR model is used to extract the features of the sample data, realize optimum compressed of fault sample data, simplify the data structure in fault diagnosis, enhance classify speed and precision. By simulating fault status of power electronic circuit, this paper investigates design details of random forests classifier and evaluates its performance. Experimental results show that the method is feasible and effective. © 2009 IEEE.

Keyword:

AR model; Fault diagnosis; Power electronic circuit; Random forests

Community:

  • [ 1 ] [Yan, R.-W.]Electrical Engineering and Automatization College, Fuzhou University, Fu Zhou, China
  • [ 2 ] [Cai, J.-D.]Electrical Engineering and Automatization College, Fuzhou University, Fu Zhou, China

Reprint 's Address:

  • [Yan, R.-W.]Electrical Engineering and Automatization College, Fuzhou University, Fu Zhou, China

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Source :

2009 2nd International Conference on Information and Computing Science, ICIC 2009

Year: 2009

Volume: 1

Page: 285-288

Language: English

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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