NTIRE 2020 challenge on real-world image super-resolution: Methods and results - Details

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This　paper　reviews　the　NTIRE　2020　challenge　on　real　world　super-resolution.　It　focuses　on　the　participating　methods　and　final　results.　The　challenge　addresses　the　real　world　setting,　where　paired　true　high　and　low-resolution　images　are　unavailable.　For　training,　only　one　set　of　source　input　images　is　therefore　provided　along　with　a　set　of　unpaired　high-quality　target　images.　In　Track　1:　Image　Processing　artifacts,　the　aim　is　to　super-resolve　images　with　synthetically　generated　image　processing　artifacts.　This　allows　for　quantitative　benchmarking　of　the　approaches　w.r.t.　a　ground-truth　image.　In　Track　2:　Smartphone　Images,　real　low-quality　smart　phone　images　have　to　be　super-resolved.　In　both　tracks,　the　ultimate　goal　is　to　achieve　the　best　perceptual　quality,　evaluated　using　a　human　study.　This　is　the　second　challenge　on　the　subject,　following　AIM　2019,　targeting　to　advance　the　state-of-the-art　in　super-resolution.　To　measure　the　performance　we　use　the　benchmark　protocol　from　AIM　2019.　In　total　22　teams　competed　in　the　final　testing　phase,　demonstrating　new　and　innovative　solutions　to　the　problem.　©　2020　IEEE.

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[ 1 ] [Lugmayr, A.]Computer Vision Lab, ETH Zurich, Switzerland
[ 2 ] [Danelljan, M.]Computer Vision Lab, ETH Zurich, Switzerland
[ 3 ] [Timofte, R.]Computer Vision Lab, ETH Zurich, Switzerland
[ 4 ] [Ahn, N.]LIX - Computer Science Laboratory at the Ecole Polytechnique, Switzerland
[ 5 ] [Bai, D.]Center of Multimedia Signal Processing, Hong Kong Polytechnic University, Hong Kong
[ 6 ] [Cai, J.]Shanghai Jiao Tong University, China
[ 7 ] [Cao, Y.]Microsoft Research Beijing, China
[ 8 ] [Chen, J.]Microsoft Research Beijing, China
[ 9 ] [Cheng, K.]Intelligent Signal Processing Laboratory, Korea University, South Korea
[ 10 ] [Chun, S.]Ajou University, South Korea
[ 11 ] [Deng, W.]Ajou University, South Korea
[ 12 ] [El-Khamy, M.]EPFL, Switzerland
[ 13 ] [Ho, C.M.]University of Udine, Italy
[ 14 ] [Ji, X.]BOE Technology Group Co.Ltd., China
[ 15 ] [Kheradmand, A.]Dalian Maritime University, China
[ 16 ] [Kim, G.]Guangdong OPPO Mobile Telecommunications Corp., Ltd, China
[ 17 ] [Ko, H.]Department of Video Information Processing, Korea University, South Korea
[ 18 ] [Lee, K.]School of Electrical Engineering, Korea University, South Korea
[ 19 ] [Lee, J.]School of Electrical Engineering, Korea University, South Korea
[ 20 ] [Li, H.]Tencent Youtu Lab Yun Cao, Tencent Youtu, China
[ 21 ] [Liu, Z.]Tencent Youtu Lab Yun Cao, Tencent Youtu, China
[ 22 ] [Liu, Z.-S.]Peking University, China
[ 23 ] [Liu, S.]Peking University, China
[ 24 ] [Lu, Y.]Peking University, China
[ 25 ] [Meng, Z.]Peking University, China
[ 26 ] [Michelini, P.N.]North China University of Technology, China
[ 27 ] [Micheloni, C.]North China University of Technology, China
[ 28 ] [Prajapati, K.]Huawei Technologies Co., Ltd, China
[ 29 ] [Ren, H.]Fuzhou University Tong Tong, Fuzhou University, Imperial Vision Technology, China
[ 30 ] [Ren, H.]Fuzhou University, Imperial Vision Technology, China
[ 31 ] [Ren, H.]Imperial Vision Technology, China
[ 32 ] [Seo, Y.H.]Fuzhou University, Imperial Vision Technology, China
[ 33 ] [Seo, Y.H.]Imperial Vision Technology, China
[ 34 ] [Siu, W.-C.]Fuzhou University, Imperial Vision Technology, China
[ 35 ] [Siu, W.-C.]Imperial Vision Technology, China
[ 36 ] [Sohn, K.-A.]Imperial Vision Technology, China
[ 37 ] [Tai, Y.]Imperial Vision Technology, China
[ 38 ] [Umer, R.M.]SOC R&D, Samsung Semiconductor, Inc., United States
[ 39 ] [Wang, S.]SOC R&D, Samsung Semiconductor, Inc., United States
[ 40 ] [Wang, H.]Ulsan National Institute of Science and Technology, South Korea
[ 41 ] [Wu, T.H.]Sardar Vallabhbhai National Institute of Technology, Surat, India
[ 42 ] [Wu, H.]Sardar Vallabhbhai National Institute of Technology, Surat, India
[ 43 ] [Yang, B.]Sardar Vallabhbhai National Institute of Technology, Surat, India
[ 44 ] [Yang, F.]Ulsan National Institute of Science and Technology, South Korea
[ 45 ] [Yoo, J.]Ulsan National Institute of Science and Technology, South Korea
[ 46 ] [Zhao, T.]Sardar Vallabhbhai National Institute of Technology, Surat, India
[ 47 ] [Zhou, Y.]Norwegian University of Science and Technology, Gjovik, Norway
[ 48 ] [Zhuo, H.]Norwegian University of Science and Technology, Gjovik, Norway
[ 49 ] [Zong, Z.]Sardar Vallabhbhai National Institute of Technology, Surat, India
[ 50 ] [Zou, X.]InnoPeak Technology, United States

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IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops

ISSN： 2160-7508

Year： 2020

Volume： 2020-June

Page： 2058-2076

Language： English

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SCOPUS Cited Count： 140

ESI Highly Cited Papers on the List： 0 Unfold All

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30 Days PV： 0

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