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author:

Fu, X. (Fu, X..) [1] | El-Sankary, K. (El-Sankary, K..) [2] | Yadong, Y. (Yadong, Y..) [3]

Indexed by:

Scopus

Abstract:

This paper presents a new technique for minimizing spurs in charge-pump phase-locked loop (PLL) using pulse injection (PI) technique. The proposed background calibration uses pulse injection in parallel with the normal operation of the PLL during its unlocked phase to extract the charge pump current mismatch error. The mismatch extraction is implemented using an error integrator and a successive approximation register (SAR) controller configured in a negative feedback to perform background calibration during the normal operation of the PLL. A windowing clock is used to extract only the error caused by the injected pulses and maintain the control voltage dc level outside of the window. Upon completion of calibration, the injection pulses are stopped and the PLL continues its operation in the lock state with minimized spur. The proposed technique successfully achieves fast calibration without interrupting the normal operation of the PLL. The simulation results show good improvements of spur reduction stemmed from the charge-pump. © 2020 IEEE.

Keyword:

Charge-pump (CP); PLLs; Pulse injection (PI); Voltage control oscillator (VCO)

Community:

  • [ 1 ] [Fu, X.]Dalhousie University, Electrical and Computer Engineering, Halifax, NS, Canada
  • [ 2 ] [El-Sankary, K.]Dalhousie University, Electrical and Computer Engineering, Halifax, NS, Canada
  • [ 3 ] [Yadong, Y.]Dalhousie University, Electrical and Computer Engineering, Halifax, NS, Canada
  • [ 4 ] [Yadong, Y.]College of Physics and Information Engineering, Fuzhou University, Fujian, China

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Source :

NEWCAS 2020 - 18th IEEE International New Circuits and Systems Conference, Proceedings

Year: 2020

Page: 98-101

Language: English

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 5

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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