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author:

Yang, W.-Y. (Yang, W.-Y..) [1] | Zhang, G.-C. (Zhang, G.-C..) [2] | Cui, Y. (Cui, Y..) [3] | Chen, H.-P. (Chen, H.-P..) [4]

Indexed by:

Scopus PKU CSCD

Abstract:

In this work, the electron transport limitations caused by oxide defects was overcome by replacing single layer semiconductor channel with a ZnO/IGZO heterojunction prepared by inkjet printing. It was found that ZnO/IGZO transistor exhibited banded electron transport, and the mobility was increased by about 9 times and 19 times, respectively, to 6.42 cm2/(V•s) compared with single layer IGZO or ZnO TFT. The switch ratio was increased by 2 and 4 orders of magnitude respectively, which can reach 1.8×108. Significant improvement in performance was associated with the two-dimensional electron gas formed between the IGZO and ZnO heterointerfaces due to the large offset of the conduction band. © 2019, Science Press. All right reserved.

Keyword:

Heterojunction; Inkjet printing; Metal oxide semiconductor; Two-dimensional electron gas

Community:

  • [ 1 ] [Yang, W.-Y.]Institute of Optoelectronic Display, National & Local United Engineering Lab of Flat Panel Display Technology, Fuzhou University, Fuzhou, 350118, China
  • [ 2 ] [Zhang, G.-C.]Institute of Optoelectronic Display, National & Local United Engineering Lab of Flat Panel Display Technology, Fuzhou University, Fuzhou, 350118, China
  • [ 3 ] [Zhang, G.-C.]Research Center for Microelectronics Technology, Fujian University of Technology, Fuzhou, 350118, China
  • [ 4 ] [Cui, Y.]Changchun Institute of Engineering and Technology, Changchun, 130012, China
  • [ 5 ] [Chen, H.-P.]Institute of Optoelectronic Display, National & Local United Engineering Lab of Flat Panel Display Technology, Fuzhou University, Fuzhou, 350118, China

Reprint 's Address:

  • [Chen, H.-P.]Institute of Optoelectronic Display, National & Local United Engineering Lab of Flat Panel Display Technology, Fuzhou UniversityChina

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Source :

Chinese Journal of Luminescence

ISSN: 1000-7032

Year: 2019

Issue: 4

Volume: 40

Page: 497-503

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count: 1

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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