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author:

Xu, Y. (Xu, Y..) [1] | Huang, Y. (Huang, Y..) [2] | Chen, W. (Chen, W..) [3] | Xue, H. (Xue, H..) [4] | Zhao, T. (Zhao, T..) [5]

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Scopus

Abstract:

Haptic technology has been widely applied in various fields as a new type of immersive interaction method. In a haptic interaction system, data may be lost due to the fluctuation of network environment, which obviously has negative influence on user's quality of experience. Error resilience is an effective method to solve the above problem. In this paper, we first establish a real haptic interaction system as the platform of the successive experiments. Then, a new quality metric named haptic perception metric (HPM) is proposed. Based on this metric, we design experiments to determine an optimal prediction algorithm for error resilience. Experimental results show that the prediction algorithm can effectively implement error resilience under different packet loss rates. It can also be confirmed that the proposed HPM metric can better reflect the quality of haptic interaction. © 2019 IEEE.

Keyword:

data prediction; error resilience; haptic interaction; quality assessment metric

Community:

  • [ 1 ] [Xu, Y.]Fujian Key Lab for Intelligent Processing and Wireless Transmission of Media Information, Fuzhou University, Fuzhou, China
  • [ 2 ] [Huang, Y.]Fujian Key Lab for Intelligent Processing and Wireless Transmission of Media Information, Fuzhou University, Fuzhou, China
  • [ 3 ] [Chen, W.]Fujian Key Lab for Intelligent Processing and Wireless Transmission of Media Information, Fuzhou University, Fuzhou, China
  • [ 4 ] [Xue, H.]Fujian Key Lab for Intelligent Processing and Wireless Transmission of Media Information, Fuzhou University, Fuzhou, China
  • [ 5 ] [Zhao, T.]Fujian Key Lab for Intelligent Processing and Wireless Transmission of Media Information, Fuzhou University, Fuzhou, China

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Source :

2019 11th International Conference on Wireless Communications and Signal Processing, WCSP 2019

Year: 2019

Language: English

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 2

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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