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author:

Gao, J. (Gao, J..) [1] | Luo, J. (Luo, J..) [2] | Geng, H. (Geng, H..) [3] | Cui, K. (Cui, K..) [4] | Zhao, Z. (Zhao, Z..) [5] | Liu, L. (Liu, L..) [6]

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Scopus

Abstract:

High aspect ratio tungsten nanowires have been prepared by selective dissolution of Nickel-aluminum-tungsten (NiAl-W) alloys which were directionally solidified at growth rates varying from 2 to 25 μm/s with a temperature gradient of 300 K•cm-1. Young's modulus and electrical resistivity of tungsten nanowires were measured by metallic mask template method. The results show that the tungsten nanowires with uniform diameter and high aspect ratio are well aligned. The length of tungsten nanowires increases with prolongation of etching time, and their length reaches 300 μm at 14 h. Young's modulus of tungsten nanowires is estimated by Hertz and Sneddon models. The Sneddon model is proper for estimating the Young's modulus, and the value of calculating Young's modulus are 260-460 GPa which approach the value of bulk tungsten. The resistivity of tungsten nanowires is measured and fitted with Fuchs-Sondheimer (FS) + Mayadas-Shatzkes (MS) model. The fitting results show that the specific resistivity of W nanowires is a litter bigger than the bulk W, and its value decreases with decreasing diameter. © 2020 by the authors.

Keyword:

Resistivity; Selective etching; Tungsten nanowires; Young's modulus

Community:

  • [ 1 ] [Gao, J.]School of Mechanical Engineering and Automation, Fuzhou University, Fu Zhou, 350108, China
  • [ 2 ] [Luo, J.]School of Mechanical Engineering and Automation, Fuzhou University, Fu Zhou, 350108, China
  • [ 3 ] [Geng, H.]School of Mechanical Engineering and Automation, Fuzhou University, Fu Zhou, 350108, China
  • [ 4 ] [Cui, K.]School of Mechanical Engineering, Northwestern Polytechnical University, Xi'an, 710072, China
  • [ 5 ] [Zhao, Z.]School of Mechanical Engineering, Northwestern Polytechnical University, Xi'an, 710072, China
  • [ 6 ] [Liu, L.]State Key Laboratory of Solidification Processing, Northwestern Polytechnical University, Xi'an, 710072, China

Reprint 's Address:

  • [Luo, J.]School of Mechanical Engineering and Automation, Fuzhou UniversityChina

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Source :

Materials

ISSN: 1996-1944

Year: 2020

Issue: 17

Volume: 13

3 . 6 2 3

JCR@2020

3 . 1 0 0

JCR@2023

ESI HC Threshold:196

JCR Journal Grade:1

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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