In　this　paper,　molecular　dynamics　simulations　were　performed　to　investigate　the　atomic-scale　imaging　of　a　typical　two-dimensional　monolayer:　molybdenum　disulfide　(MoS2).　With　a　constant　height　mode,　force-displacement　curves　of　tips　along　a　straight-line　scanning　path　indicate　resonant　waveforms　and　the　periodicities　are　capable　of　characterizing　lattice　parameters　of　monolayer　MoS2.　Some　characteristic　sites　in　the　force-displacement　curves　arise　only　for　tips　with　a　radius　of　less　than　3　Å　under　1.47　Å　tip-sample　distance,　which　correlated　to　the　atoms　next　to　the　scanning　path.　Such　characteristic　sites　can　be　reproduced　by　using　tips　with　a　radius　of　7　Å　via　increasing　the　tip-sample　distance.　The　underlying　mechanism　was　illustrated　by　the　number　of　interactive　atoms　between　the　tip　and　the　sample.　The　work　may　shed　light　on　the　atomic　force　microscope　(AFM)　operation　when　one　expects　to　achieve　high-resolution　AFM　imaging　of　2D　materials　with　a　worn　AFM　tip.　©　2019　The　Japan　Society　of　Applied　Physics.