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author:

Ren, Y. (Ren, Y..) [1] | Huang, S. (Huang, S..) [2] | Shen, L. (Shen, L..) [3] | Liu, X. (Liu, X..) [4] | Du, G. (Du, G..) [5]

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Abstract:

In this work, the impact of well doping and corresponding body bias on UTBB MOSFETs is investigated. The ability of threshold voltage adjustment is evaluated. The results indicate that well doping can change the threshold voltage both of the N and P channel UTBB MOSFETs. The maximum amplitude for a typical 26 nm gate length device is about 100 mV, and these correspond to the cases of devices with an inverse type of high concentration dopant. The body bias adjusts the threshold voltage at a rate of 100-140 mV/V for the UTBB MOSFETs with a well. By optimizing well doping and body biasing, multi-threshold-voltage UTBB MOSFETs can be designed and optimized for lower power application. © 2018 Chinese Institute of Electronics.

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Community:

  • [ 1 ] [Ren, Y.]College of Physics and Information Engineering, Fuzhou University, Fuzhou, 350108, China
  • [ 2 ] [Huang, S.]College of Physics and Information Engineering, Fuzhou University, Fuzhou, 350108, China
  • [ 3 ] [Shen, L.]Institute of Microelectronics, Peking University, Beijing, 100871, China
  • [ 4 ] [Liu, X.]Institute of Microelectronics, Peking University, Beijing, 100871, China
  • [ 5 ] [Du, G.]Institute of Microelectronics, Peking University, Beijing, 100871, China

Reprint 's Address:

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    [Huang, S.]College of Physics and Information Engineering, Fuzhou UniversityChina

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Source :

Journal of Semiconductors

ISSN: 1674-4926

CN: 11-5781/TN

Year: 2018

Issue: 12

Volume: 39

4 . 8 0 0

JCR@2023

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 1

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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