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Abstract:
Up to now the approaches of fault diagnosis at subnetwork-level for analog circuits using self-testing and mutual-testing are confronted with an essential core problem: Is there an error area when the constrain that all torn nodes are accessible has been broken through? What rule must be followed for the distribution of the accessible nodes? This paper presents a theorem to answer it, and proves that if all torn nodes are accessible it is a special situation of this research for no error area in existence.
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Acta Electronica Sinica
ISSN: 0372-2112
Year: 1995
Issue: 8
Volume: 23
Page: 75-77
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SCOPUS Cited Count:
ESI Highly Cited Papers on the List: 0 Unfold All
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30 Days PV: 0
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