In　order　to　efficiently　evaluate　the　operating　status　of　photovoltaic　(PV)　arrays,　a　design　of　fast　current-voltage　(I-V)　characteristic　tester　is　proposed　in　this　paper.　The　tester　uses　the　dynamic　capacitor　charging　method　to　quickly　sweep　I-V　characteristic　curves.　Then,　a　new　artificial　bee　colony　and　Nelder-Mead　simplex　(ABC-NMS)　hybrid　algorithm　is　used　to　extract　parameters　of　the　single　diode　model　of　PV　arrays.　The　experimental　results　show　that　the　tester　can　quickly　measure　high-quality　I-V　curves　of　PV　array　and　achieve　accurate　model　parameters　extraction.　In　addition,　the　root　mean　square　error　(RMSE)　of　curve　fitting　can　be　used　to　effectively　indicate　the　partial　shading　condition.　©　2018　The　Authors.　Published　by　Elsevier　Ltd.