Influences of Extremely Low Frequency Electromagnetic Fields on Germination and Early Growth of Mung Beans - Details

author：

Huang, P.-C. (Huang, P.-C..) ^[1] | Tang, J.-Y. (Tang, J.-Y..) ^[2] | Feng, C.-H. (Feng, C.-H..) ^[3] | Cheng, P.-Y. (Cheng, P.-Y..) ^[4] | Jang, L.-S. (Jang, L.-S..) ^[5]

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Abstract：

This　study　aims　to　assess　extremely　low　frequency　electromagnetic　field　(ELF-EMF),　which　is　similar　to　Schumann　resonance　(SR)　frequency.　Schumann　resonance　frequency　which　is　part　of　the　geomagnetic　field　frequency,　affects　to　mung　beans　to　increase　germination　rate　and　early　growth.　The　aim　of　the　study　is　to　evaluate　the　effects　of　SR　ELF-EMF　on　mung　beans　germination　rate　and　growth　rate.　SR　ELF-EMF　pretreatment　increases　the　germination　rate　since　the　applied　SR　ELF-EMF　promotes　level　of　Ca　2+　and　K　+　contents.　Three　groups　of　mung　beans　were　exposed　by　SR　ELF-EMF　of　0.3　mT　at　swapped　frequency　7.83　Hz　pm　0.1　Hz.　The　experiment　results　show　that　germination　rates　of　experimental　groups　with　SR　ELF-EMF　exposing　have　8%　to　23.3%　higher　than　control　groups.　Moreover,　the　length　of　stem　of　the　experimental　groups　have　the　maximum　14%　longer　than　control　groups　after　72　hours　growth.　©　2018　IEEE.

Keyword：

extremely low frequency electromagnetic field (ELF-EMF); germination rate; Schumann resonance frequency

Community：

[ 1 ] [Huang, P.-C.]College of Computer and Information Sciences, Fujian Agriculture and Forestry University, Fujian, China
[ 2 ] [Tang, J.-Y.]Department of Electrical Engineering, National Cheng Kung University, Tainan, Taiwan
[ 3 ] [Feng, C.-H.]College of Physics and Information Engineering, Fuzhou University, Fujian, China
[ 4 ] [Cheng, P.-Y.]Department of Mechanical Engineering, Southern Taiwan University of Science and Technology, Tainan, Taiwan
[ 5 ] [Jang, L.-S.]Department of Electrical Engineering, National Cheng Kung University, Tainan, Taiwan

Reprint 's Address：

[Jang, L.-S.]Department of Electrical Engineering, National Cheng Kung UniversityTaiwan

Email：

lsjang@ee.ncku.edu.tw

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Source ：

2018 IEEE International Conference on Consumer Electronics-Taiwan, ICCE-TW 2018

Year： 2018

Language： English

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SCOPUS Cited Count： 2

ESI Highly Cited Papers on the List： 0 Unfold All

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30 Days PV： 0

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