This　paper　presents　two　new　torn-searched　approaches　for　fault　diagnosis　at　subnetwork-level　in　analog　circuits　and　verifies　its　practical　diagnosability.　These　approaches　break　through　the　limitation　that　all　torn　terminals　(incident　nodes)　must　be　accessible　and　the　mutual-testing　way　must　be　utilized　to　locate　the　faulty　subnetworks.　As　far　as　diagnosability　is　concerned,　its　applications　would　be　more　extensive　as　compared　with　the　unified　decomposition　approach.　So　it　should　more　satisfy　with　engineering　needs.