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author:

Huang, Feng Ying (Huang, Feng Ying.) [1] | Wang, Jun (Wang, Jun.) [2] | Xu, Yu Sen (Xu, Yu Sen.) [3] | Huang, Ji Wei (Huang, Ji Wei.) [4] (Scholars:黄继伟)

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EI Scopus

Abstract:

This paper proposes a new synchronized serial-parallel CRC(Cycle Redundancy Check) with PIE(Pulse Interval Encoding) decoding circuit for the UHF(Ultra-High Frequency) RFID(Radio Frequency Identification), which is based on the ISO/IEC 18000-6C standards protocol. The parallel algorithm of CRC circuit is derived, and the serial or parallel CRC circuit on RFID tag chip is evaluated in this paper. Finally, the designed circuit is simulated and analyzed on the FPGA platform. Simulation results show that the proposed circuit meets the communication requirement of the protocol and addresses the problem of low data processing rate of conventional serial CRC circuit, as well as implements 1 to 8 degree of parallelism of the parallel CRC circuit for UHF RFID. © (2013) Trans Tech Publications, Switzerland.

Keyword:

Data processing Decoding Electric network analysis Field programmable gate arrays (FPGA) Manufacture Network protocols Radio frequency identification (RFID)

Community:

  • [ 1 ] [Huang, Feng Ying]Depatment of Physics and Information Engineering, Fuzhou University, China
  • [ 2 ] [Huang, Feng Ying]Fujian Integrated Circuit Design Center, Fuzhou 350002, China
  • [ 3 ] [Wang, Jun]Fujian Integrated Circuit Design Center, Fuzhou 350002, China
  • [ 4 ] [Xu, Yu Sen]Depatment of Physics and Information Engineering, Fuzhou University, China
  • [ 5 ] [Xu, Yu Sen]Fujian Integrated Circuit Design Center, Fuzhou 350002, China
  • [ 6 ] [Huang, Ji Wei]Depatment of Physics and Information Engineering, Fuzhou University, China
  • [ 7 ] [Huang, Ji Wei]Fujian Integrated Circuit Design Center, Fuzhou 350002, China

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Source :

ISSN: 1022-6680

Year: 2013

Volume: 816-817

Page: 957-961

Language: English

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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