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author:

Zhao, Long (Zhao, Long.) [1] | Zhou, Yuhao (Zhou, Yuhao.) [2] | Chen, Kun-Long (Chen, Kun-Long.) [3] | Rau, Shiuan-Hau (Rau, Shiuan-Hau.) [4] | Lee, Wei-Jen (Lee, Wei-Jen.) [5]

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EI

Abstract:

Unlike short circuit faults in power systems, arcing faults produce intense light during the events. Light sensing technology has been developed as a part of arc faults detection since 1980's. Currently, optical fiber and point sensors are 2 types of light sensors which have been applied along with simultaneous over-current mechanism for arc flash relays. Due to the characteristics of light sensors, sensitivity and reliability of the relay may be affected by the ambient light. This paper proposes a new approach for arc flash fault detection by using spectrum of the light. Electromagnetic radiation means different element would emit spectra with unique wavelengths when their atoms are excited. Therefore, elements can be identified if specific emission spectrum are detected during the excitation period. In general, Copper and Aluminum are commonly used for conductors. By examining the spectrum of the light, arc flash can be accurately and quickly detected. In the experiment of this study, copper and aluminum are applied as conductors. The light spectrum for both materials are measured and recorded by an optic spectrometer during the arcing incidents. The results show that accuracy and reliability of the light-based arc flash fault detection operation can be improved by using the proposed method. © 2018 IEEE.

Keyword:

Aluminum Arc lamps Copper Electromagnetic waves Emission spectroscopy Fault detection Optical fibers

Community:

  • [ 1 ] [Zhao, Long]Electrical Engineering Department, University of Texas at Arlington, Arlington; TX; 76019, United States
  • [ 2 ] [Zhou, Yuhao]Electrical Engineering Department, University of Texas at Arlington, Arlington; TX; 76019, United States
  • [ 3 ] [Chen, Kun-Long]College of Electrical Engineering and Automation, Fuzhou University, Fuzhou, Fujian; 35011, China
  • [ 4 ] [Rau, Shiuan-Hau]Shermco Industries, Inc, Irving; TX; 75061, United States
  • [ 5 ] [Lee, Wei-Jen]Electrical Engineering Department, University of Texas at Arlington, Arlington; TX; 76019, United States

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ISSN: 2326-3288

Year: 2018

Volume: 2018-January

Language: English

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count: 6

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 3

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