Carbon　nanotubes　(CNTs)　are　wildly　regarded　as　ideal　probe　tips　for　atomic　force　microscopy　(AFM)　to　improve　the　resolution,　due　to　its　small　size,　high　aspect　ratio,　strong　mechanical　property,　high　flexibility,　unique　chemical　and　electric　properties.　According　to　the　properties　of　their　procedures,　the　representative　examples　of　CNT　probes　are　classified　into　two　major　methods:　an　assembling　method　in　which　readily　available　CNTs　are　manipulated　to　attach　on　the　tip　of　conventional　silicon　probe　using　manual　operation　or　electromagnetic　fields,　and　a　growing　method　in　which　CNTs　are　directly　grown　from　the　apex　of　silicon　probe　or　silicon　cantilever　beam　by　a　chemical　vapor　deposition　(CVD)　process.　In　conclusion,　the　limitations　of　each　method　are　also　discussed.