• Complex
  • Title
  • Keyword
  • Abstract
  • Scholars
  • Journal
  • ISSN
  • Conference
成果搜索

author:

Xu, W.C. (Xu, W.C..) [1] | Dai, P.Q. (Dai, P.Q..) [2] | Wu, X.L. (Wu, X.L..) [3]

Indexed by:

EI

Abstract:

In the present work, nanocrystalline Ni (nc-Ni) with a broad grain size distribution (BGSD) of 5-120 nm and an average grain size of 27·2 nm was prepared. The BGSD nc-Ni sample shows a similar strength and good ductility in comparison with electrodeposited nc-Ni with a narrow grain size distribution. The intracrystalline dislocation network was observed in the post-deformed microstructure confirming the conventional intracrystalline dislocation sliding mechanism in BGSD nc-Ni. The uniaxial tensile loading-unloading-loading deformation shows BGSD nc-Ni has the capability to store dislocations in the grain interior, which is very limited compared with that of coarse grained metals. For BGSD nc-Ni, the strain rate sensitivity of flow stress m enhances with decreasing strain rate. At the strain rate of 5 × 10-6 s-1, m was estimated to be 0·055. At the corresponding strain rate, the enhanced ductility along with the decreased strength was achievable, indicating activation of other deformation mechanisms, e.g. grain boundary sliding or diffusion. © 2010 Maney Publishing.

Keyword:

Deformation Dislocations (crystals) Ductility Electrodeposition Electrodes Grain boundary sliding Grain growth Grain size and shape Nanocrystals Size distribution Strain rate Unloading

Community:

  • [ 1 ] [Xu, W.C.]College of Materials Science and Engineering, Fuzhou University, Fuzhou 350108, China
  • [ 2 ] [Dai, P.Q.]College of Materials Science and Engineering, Fuzhou University, Fuzhou 350108, China
  • [ 3 ] [Wu, X.L.]State Key Laboratory of Nonlinear Mechanics, Institute of Mechanics, Chinese Academy of Sciences, Beijing 100080, China

Reprint 's Address:

Show more details

Related Keywords:

Source :

Materials Science and Technology

ISSN: 0267-0836

Year: 2010

Issue: 5

Volume: 26

Page: 591-596

0 . 7 0 9

JCR@2010

1 . 7 0 0

JCR@2023

JCR Journal Grade:2

CAS Journal Grade:3

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 2

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

Affiliated Colleges:

Online/Total:62/10065424
Address:FZU Library(No.2 Xuyuan Road, Fuzhou, Fujian, PRC Post Code:350116) Contact Us:0591-22865326
Copyright:FZU Library Technical Support:Beijing Aegean Software Co., Ltd. 闽ICP备05005463号-1