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author:

Wang, Lingjie (Wang, Lingjie.) [1] | Lin, Jinyang (Lin, Jinyang.) [2] | You, Yuxiang (You, Yuxiang.) [3] | Ye, Yun (Ye, Yun.) [4] | Yang, Zunxian (Yang, Zunxian.) [5] | Guo, Tailiang (Guo, Tailiang.) [6]

Indexed by:

EI PKU CSCD

Abstract:

The back-gate field emission display (FED) panel was fabricated with the well-defined SnO2 nano-wire, over 10 μm long, 150 nm in diameter, grown by chemical vapor deposition (CVD). The microstructures of the SnO2 nanowires were characterized with X-ray diffraction, and scanning electron microscopy. The back-gate FED device was then constructed with the SnO2 nanowires arrays, transferred from the crucible to the cathode via screen printing. The field emission characteristics of the prototyped device were evaluated. The preliminary results show that the gate is capable of regulating the emission characteristics. Besides, at an anode of 1600 V and a gate voltage of 200 V, full screen emission was clearly observed with an averaged luminance of 560 cd/m2.

Keyword:

Chemical vapor deposition Field emission Field emission cathodes Field emission displays Nanowires Scanning electron microscopy X ray diffraction

Community:

  • [ 1 ] [Wang, Lingjie]College of Physics and Information Engineering, Fuzhou University, Fuzhou 350002, China
  • [ 2 ] [Wang, Lingjie]Department of Mathematics and Physics, Xiamen University of Technology, Xiamen 361024, China
  • [ 3 ] [Lin, Jinyang]College of Physics and Information Engineering, Fuzhou University, Fuzhou 350002, China
  • [ 4 ] [You, Yuxiang]College of Physics and Information Engineering, Fuzhou University, Fuzhou 350002, China
  • [ 5 ] [Ye, Yun]College of Physics and Information Engineering, Fuzhou University, Fuzhou 350002, China
  • [ 6 ] [Yang, Zunxian]College of Physics and Information Engineering, Fuzhou University, Fuzhou 350002, China
  • [ 7 ] [Guo, Tailiang]College of Physics and Information Engineering, Fuzhou University, Fuzhou 350002, China

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Source :

Journal of Vacuum Science and Technology

ISSN: 1672-7126

Year: 2012

Issue: 3

Volume: 32

Page: 188-191

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count: 1

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 3

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