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author:

Lin, Naichang (Lin, Naichang.) [1] | Yang, Xiaoxiang (Yang, Xiaoxiang.) [2] | Lin, Wenjian (Lin, Wenjian.) [3] | Zhu, Zhibin (Zhu, Zhibin.) [4]

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EI Scopus PKU CSCD

Abstract:

A new method was introduced to accurately detect the defects of time of flight diffraction (TOFD) D scanning image. First, the clutter suppression algorithm based on energy distribution was used to remove direct wave and reflected bottom wave. The background clutter could be removed through algorithms of binarization processing, edge detection, corrosion, clustering and removal of small clusters. Then, a parabola was fitted through the least square method, and ordinate vectors of feature points and fitted points were on the correlation processing. With the matching degree of defects and parabola, the defects could be detected. The results demonstrate that the proposed method was effective and accurate.

Keyword:

Clutter (information theory) Corrosion Defects Diffraction Echo suppression Edge detection Least squares approximations

Community:

  • [ 1 ] [Lin, Naichang]College of Mechanical Engineering and Automation, Fuzhou University, Fuzhou 350108, China
  • [ 2 ] [Lin, Naichang]Xiamen Inspection Institute of Special Equipments, Xiamen 361000, China
  • [ 3 ] [Yang, Xiaoxiang]College of Mechanical Engineering and Automation, Fuzhou University, Fuzhou 350108, China
  • [ 4 ] [Yang, Xiaoxiang]College of Chemistry and Chemical Engineering, Fuzhou University, Fuzhou 350108, China
  • [ 5 ] [Lin, Wenjian]College of Chemistry and Chemical Engineering, Fuzhou University, Fuzhou 350108, China
  • [ 6 ] [Zhu, Zhibin]Xiamen Inspection Institute of Special Equipments, Xiamen 361000, China
  • [ 7 ] [Zhu, Zhibin]College of Chemistry and Chemical Engineering, Fuzhou University, Fuzhou 350108, China

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Source :

Transactions of the China Welding Institution

ISSN: 0253-360X

CN: 23-1178/TG

Year: 2014

Issue: 6

Volume: 35

Page: 105-108

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 5

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