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author:

Ooi, Poh Choon (Ooi, Poh Choon.) [1] | Lin, Jian (Lin, Jian.) [2] | Kim, Tae Whan (Kim, Tae Whan.) [3] | Li, Fushan (Li, Fushan.) [4]

Indexed by:

EI

Abstract:

Indium-tin-oxide (ITO) free, nonvolatile memory (NVM) devices based on graphene quantum dots (GQDs) sandwiched between polymethylsilsesquioxane (PMSSQ) layers were fabricated directly on polyethylene terephthalate (PET) substrates by using a solution process technique. Current-voltage (I-V) curves for the silver nanowire/PMSSQ/GQD/PMSSQ/poly(3,4-ethylenethiophene):poly(styrene sulfonate)/PET devices at 300 K showed a current bistability. The ON/OFF ratio of the current bistability for the NVM devices was as large as 1 × 104, and the cycling endurance time of the ON/OFF switching for the NVM devices was above 1 × 104 s. The Schottky emission, Poole-Frenkel emission, trapped-charge limited-current, and space-charge-limited current were dominantly attributed to the conduction mechanisms for the fabricated NVM devices based on the obtained I-V characteristics, and energy band diagrams illustrating the 'writing' and the 'erasing' processes of the devices. © 2016 Elsevier B.V. All rights reserved.

Keyword:

Graphene Graphene devices Indium compounds Nanocrystals Nonvolatile storage Plastic bottles Semiconductor quantum dots Styrene Tin oxides

Community:

  • [ 1 ] [Ooi, Poh Choon]Department of Electronics and Computer Engineering, Hanyang University, Seoul; 133-791, Korea, Republic of
  • [ 2 ] [Ooi, Poh Choon]Institute of Optoelectronic Display, Fuzhou University, Fuzhou; 350002, China
  • [ 3 ] [Lin, Jian]Institute of Optoelectronic Display, Fuzhou University, Fuzhou; 350002, China
  • [ 4 ] [Kim, Tae Whan]Department of Electronics and Computer Engineering, Hanyang University, Seoul; 133-791, Korea, Republic of
  • [ 5 ] [Li, Fushan]Institute of Optoelectronic Display, Fuzhou University, Fuzhou; 350002, China

Reprint 's Address:

  • [kim, tae whan]department of electronics and computer engineering, hanyang university, seoul; 133-791, korea, republic of

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Source :

Organic Electronics

ISSN: 1566-1199

Year: 2016

Volume: 32

Page: 115-119

3 . 3 9 9

JCR@2016

2 . 7 0 0

JCR@2023

ESI HC Threshold:186

JCR Journal Grade:1

CAS Journal Grade:2

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 2

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