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author:

Gu, Tianqi (Gu, Tianqi.) [1] | Ji, Shijun (Ji, Shijun.) [2] | Lin, Shuwen (Lin, Shuwen.) [3] | Luo, Tianzhi (Luo, Tianzhi.) [4]

Indexed by:

EI

Abstract:

The Moving Total Least Squares (MTLS) method has been developed to fit for the measurement data contaminated with errors. Different from the moving least squares method which only takes into account the error of dependent variable, MTLS method considers the errors of all the variables, which determines the local approximants in the sense of the orthogonal direction. MTLS method is more reasonable than MLS method for dealing with errors-in-variables (EIV) model. But due to the construction way of local approximants, it is time consuming and difficult to change the order of basis function. This paper presents an Improved Moving Total Least Squares (IMTLS) method, in which Total Least Square (TLS) based on singular value decomposition is introduced to the local approximants. IMTLS achieves the parameter estimation of local approximants using weight matrix instead of weight function with compact support in MTLS method. Several examples of curve and surface fitting are given to demonstrate the performance of IMTLS method. © 2015 Elsevier Ltd. All rights reserved.

Keyword:

Curve fitting Errors Least squares approximations Singular value decomposition Surface reconstruction

Community:

  • [ 1 ] [Gu, Tianqi]College of Mechanical Engineering and Automation, Fuzhou University, Fuzhou; 350108, China
  • [ 2 ] [Ji, Shijun]College of Mechanical Science and Engineering, Jilin University, Changchun; 130025, China
  • [ 3 ] [Lin, Shuwen]College of Mechanical Engineering and Automation, Fuzhou University, Fuzhou; 350108, China
  • [ 4 ] [Luo, Tianzhi]College of Mechanical Engineering and Automation, Fuzhou University, Fuzhou; 350108, China

Reprint 's Address:

  • [ji, shijun]college of mechanical science and engineering, jilin university, changchun; 130025, china

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Source :

Measurement: Journal of the International Measurement Confederation

ISSN: 0263-2241

Year: 2016

Volume: 78

Page: 278-282

2 . 3 5 9

JCR@2016

5 . 2 0 0

JCR@2023

ESI HC Threshold:177

JCR Journal Grade:1

CAS Journal Grade:3

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 11

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 2

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