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author:

Zhao, Dandan (Zhao, Dandan.) [1] | Fang, Lihua (Fang, Lihua.) [2] | Tang, Dian (Tang, Dian.) [3] | Zhang, Teng (Zhang, Teng.) [4]

Indexed by:

EI

Abstract:

In solid oxide fuel cell (SOFC) stacks, the volatile boron species present in the sealing glass often react with the lanthanum-containing cathode, degrading the activity of the cathode (this phenomenon is known as boron poisoning). In this work, we report that this detrimental reaction can be effectively reduced by doping bismuth-containing borosilicate sealing glass-ceramic with a niobium dopant. The addition of Nb2O5 not only condenses the [SiO4] structural units in the glass network, but also promotes the conversion of [BO3] to [BO4]. Moreover, the Nb2O5 dopant enhances the formation of boron-containing phases (Ca3B2O6 and CaB2Si2O8), which significantly reduces the volatility of boron compounds in the sealing glass, suppressing the formation of LaBO3 in the reaction couple between the glass and the cathode. The reported results provide a new approach to solve the problem of boron poisoning. © 2016 Elsevier B.V. All rights reserved.

Keyword:

Bismuth compounds Boron compounds Calcium compounds Cathodes Glass Lanthanum Lanthanum compounds Niobium oxide Silicon compounds Solid oxide fuel cells (SOFC) Thermodynamic stability

Community:

  • [ 1 ] [Zhao, Dandan]College of Materials Science and Engineering, Fuzhou University, Fuzhou, Fujian; 350108, China
  • [ 2 ] [Fang, Lihua]College of Materials Science and Engineering, Fuzhou University, Fuzhou, Fujian; 350108, China
  • [ 3 ] [Tang, Dian]College of Materials Science and Engineering, Fuzhou University, Fuzhou, Fujian; 350108, China
  • [ 4 ] [Zhang, Teng]College of Materials Science and Engineering, Fuzhou University, Fuzhou, Fujian; 350108, China

Reprint 's Address:

  • [zhang, teng]college of materials science and engineering, fuzhou university, fuzhou, fujian; 350108, china

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Source :

Journal of Power Sources

ISSN: 0378-7753

Year: 2016

Volume: 325

Page: 549-554

6 . 3 9 5

JCR@2016

8 . 1 0 0

JCR@2023

ESI HC Threshold:324

JCR Journal Grade:1

CAS Journal Grade:1

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 7

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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