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author:

Jeon, Young Pyo (Jeon, Young Pyo.) [1] | Wu, Chaoxing (Wu, Chaoxing.) [2] | Yoo, Keon-Ho (Yoo, Keon-Ho.) [3] | Kim, Tae Whan (Kim, Tae Whan.) [4]

Indexed by:

EI

Abstract:

We fabricated triboelectric nanogenerators (TENGs) consisting of an Al electrode, a polyimide dielectric layer, a ZnO dielectric layer, and an indium tin oxide (ITO) electrode, and we observed an enhancement of the output voltage that was due to Al doping in the ZnO layer. The variation in the surface of the Al doped zinc oxide (AZO) layer, which was found to depend on the Al doping concentration, was studied by using scanning electron microscopy. The existence of Al particles was identified from the X-ray photoelectron spectroscopy results. The open-circuit voltage and the short-circuit current of the TENGs with 2% and 5% Al doping in the ZnO layer and operating in the vertical contact-separation mode were larger than those of TENGs having a ZnO layer without Al doping, respectively. The Al doping reduced the asymmetry of negative and positive output voltages and shortened the duration of the positive peaks. The enhancement in the output properties of the TENGs due to the dielectric properties of the Al particles, which was theoretically analyzed in the contact-separation mode operated TENGs with dimensionless formulations, which is compared with the experimental results. © 2020 Elsevier B.V.

Keyword:

Aluminum metallography Aluminum oxide Dielectric properties Electrodes II-VI semiconductors Indium compounds Nanogenerators Nanotechnology Open circuit voltage Oxide minerals Scanning electron microscopy Tin oxides Triboelectricity X ray photoelectron spectroscopy Zinc metallography Zinc oxide

Community:

  • [ 1 ] [Jeon, Young Pyo]Department of Electronics and Computer Engineering, Hanyang University, Seoul; 04763, Korea, Republic of
  • [ 2 ] [Wu, Chaoxing]College of Physics and Information Engineering, Fuzhou University, Fuzhou; 350108, China
  • [ 3 ] [Yoo, Keon-Ho]Department of Physics and Research Institute for Basic Sciences, Kyung Hee University, Seoul; 02447, Korea, Republic of
  • [ 4 ] [Kim, Tae Whan]Department of Electronics and Computer Engineering, Hanyang University, Seoul; 04763, Korea, Republic of

Reprint 's Address:

  • [kim, tae whan]department of electronics and computer engineering, hanyang university, seoul; 04763, korea, republic of

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Source :

Journal of Alloys and Compounds

ISSN: 0925-8388

Year: 2020

Volume: 831

5 . 3 1 6

JCR@2020

5 . 8 0 0

JCR@2023

ESI HC Threshold:196

JCR Journal Grade:1

CAS Journal Grade:2

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 14

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 2

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