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author:

Gu, Tianqi (Gu, Tianqi.) [1] | Tu, Yi (Tu, Yi.) [2] | Tang, Dawei (Tang, Dawei.) [3] | Lin, Shuwen (Lin, Shuwen.) [4] | Fang, Bing (Fang, Bing.) [5]

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Abstract:

The moving least-squares (MLS) method has been developed for fitting measurement data contaminated with errors. The local approximants of the MLS method only take the random errors of the dependent variable into account, whereas the independent variables of measurement data always contain errors. To consider the influence of errors of dependent and independent variables, the moving total least-squares (MTLS) method is a better choice. However, both MLS and MTLS methods are sensitive to outliers, greatly affecting fitting accuracy and robustness. This paper presents an improved method, the trimmed MTLS (TrMTLS) method, in which the total least-squares method with a truncation procedure is adopted to determine the local coefficients in the influence domain. This method can deal with outliers and random errors of all variables without setting the threshold or adding small weights subjectively. The results of numerical simulation and experimental measurements indicate that the proposed algorithm has better fitting accuracy and robustness than the MTLS and MLS methods. © 2020 IOP Publishing Ltd.

Keyword:

Curve fitting Least squares approximations Numerical methods Random errors Statistics Surface fitting

Community:

  • [ 1 ] [Gu, Tianqi]School of Mechanical Engineering and Automation, Fuzhou University, Fuzhou; 350108, China
  • [ 2 ] [Tu, Yi]School of Mechanical Engineering and Automation, Fuzhou University, Fuzhou; 350108, China
  • [ 3 ] [Tang, Dawei]EPSRC Future Metrology Hub, University of Huddersfield, Huddersfield; HD1 3DH, United Kingdom
  • [ 4 ] [Lin, Shuwen]School of Mechanical Engineering and Automation, Fuzhou University, Fuzhou; 350108, China
  • [ 5 ] [Fang, Bing]School of Mechanical and Electronic Engineering, Fujian Agriculture and Forestry University, Fuzhou; 350002, China

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Source :

Measurement Science and Technology

ISSN: 0957-0233

Year: 2020

Issue: 4

Volume: 31

2 . 0 4 6

JCR@2020

2 . 7 0 0

JCR@2023

ESI HC Threshold:132

JCR Journal Grade:3

CAS Journal Grade:4

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 13

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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