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author:

Wang, Ying-Ming (Wang, Ying-Ming.) [1] (Scholars:王应明) | Chin, Kwai-Sang (Chin, Kwai-Sang.) [2]

Indexed by:

EI Scopus SCIE

Abstract:

Selection of advanced manufacturing technologies (AMTs) is an important yet complex decision which requires careful consideration of various performance criteria. This paper proposes the use of data envelopment analysis (DEA) with double frontiers for the selection of AMTs, which considers not only the best (optimistic), but also the worst (pessimistic) relative efficiencies of each AMT. Compared with the traditional DEA, the DEA approach with double frontiers can identify the best AMT correctly and easily without the need to impose any weight restriction or the need to calculate the cross-efficiency matrix, which requires a large number of computations and may also result in inconsistent conclusions by aggressive and benevolent cross-efficiency models. Four numerical examples are examined using the DEA approach with double frontiers to illustrate its simplicity and usefulness in AMT selection and justification.

Keyword:

advanced manufacturing technology AMT selection and justification data envelopment analysis DEA with double frontiers optimistic and pessimistic efficiencies overall performance

Community:

  • [ 1 ] [Wang, Ying-Ming]Fuzhou Univ, Sch Publ Adm, Fuzhou 350002, Peoples R China
  • [ 2 ] [Wang, Ying-Ming]City Univ Hong Kong, Dept Mfg Engn & Engn Management, Kowloon Tong, Hong Kong, Peoples R China
  • [ 3 ] [Chin, Kwai-Sang]City Univ Hong Kong, Dept Mfg Engn & Engn Management, Kowloon Tong, Hong Kong, Peoples R China

Reprint 's Address:

  • 王应明

    [Wang, Ying-Ming]Fuzhou Univ, Sch Publ Adm, Fuzhou 350002, Peoples R China

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Source :

INTERNATIONAL JOURNAL OF PRODUCTION RESEARCH

ISSN: 0020-7543

Year: 2009

Issue: 23

Volume: 47

Page: 6663-6679

0 . 8 0 3

JCR@2009

7 . 0 0 0

JCR@2023

ESI Discipline: ENGINEERING;

JCR Journal Grade:3

CAS Journal Grade:1

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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