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author:

Zhong, Shuncong (Zhong, Shuncong.) [1] (Scholars:钟舜聪) | Zhang, Qiukun (Zhang, Qiukun.) [2] (Scholars:张秋坤)

Indexed by:

EI Scopus SCIE

Abstract:

We report a subnanoscale-displacement-resolution optical coherence vibration tomography (SOCVT) system for real-time calibration of piezoelectric actuators. The calibrations of the actuators at nanoscale or microscale displacement ranges were performed by varying the input voltage over the entire range in the ascending and descending directions. The computational and experimental results demonstrated that the developed SOCVT could be used to characterize the dynamic hysteretic behavior, nonlinear effect, and impulsive behavior of piezoelectric actuators. The SOCVT technique is non-contact and non-invasive in nature, making it ideal for real-time and in situ ultra-precision calibration of piezoelectric actuators, which are widely used in active vibration control and nanopositioning. (C) 2015 Elsevier B.V. All rights reserved.

Keyword:

Enhanced optical coherence vibration Nanopositioning Piezoelectric actuators Real-time calibration tomography

Community:

  • [ 1 ] [Zhong, Shuncong]Univ Strathclyde, Dept Naval Architecture Ocean & Marine Engn, Glasgow G4 0LZ, Lanark, Scotland
  • [ 2 ] [Zhong, Shuncong]Fuzhou Univ, Sch Mech Engn & Automat, Lab Opt Terahertz & Nondestruct Testing, Fuzhou 350108, Peoples R China
  • [ 3 ] [Zhang, Qiukun]Fuzhou Univ, Sch Mech Engn & Automat, Lab Opt Terahertz & Nondestruct Testing, Fuzhou 350108, Peoples R China
  • [ 4 ] [Zhang, Qiukun]Fujian Key Lab Med Instrument & Pharmaceut Techno, Fuzhou 350108, Peoples R China

Reprint 's Address:

  • 钟舜聪

    [Zhong, Shuncong]Univ Strathclyde, Dept Naval Architecture Ocean & Marine Engn, Henry Dyer Bldg,100 Montrose St, Glasgow G4 0LZ, Lanark, Scotland

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Source :

SENSORS AND ACTUATORS A-PHYSICAL

ISSN: 0924-4247

Year: 2015

Volume: 233

Page: 42-46

2 . 2 0 1

JCR@2015

4 . 1 0 0

JCR@2023

ESI Discipline: ENGINEERING;

ESI HC Threshold:183

JCR Journal Grade:1

CAS Journal Grade:2

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 3

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