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Timely and accurate monitoring of cropping intensity (CI) is essential to help us understand changes in food production. This paper aims to develop an automatic Cropping Intensity extraction method based on the Isolines of Wavelet Spectra (CIIWS) with consideration of intra-class variability. The CIIWS method involves the following procedures: (1) characterizing vegetation dynamics from time-frequency dimensions through a continuous wavelet transform performed on vegetation index temporal profiles; (2) deriving three main features, the skeleton width, maximum number of strong brightness centers and the intersection of their scale intervals, through computing a series of wavelet isolines from the wavelet spectra; and (3) developing an automatic cropping intensity classifier based on these three features. The proposed CIIWS method improves the understanding in the spectral-temporal properties of vegetation dynamic processes. To test its efficiency, the CIIWS method is applied to China's Henan province using 250 m 8 days composite Moderate Resolution Imaging Spectroradiometer (MODIS) Enhanced Vegetation Index (EVI) time series datasets. An overall accuracy of 88.9% is achieved when compared with in-situ observation data. The mapping result is also evaluated with 30 m Chinese Environmental Disaster Reduction Satellite (HJ-1)-derived data and an overall accuracy of 86.7% is obtained. At county level, the MODIS-derived sown areas and agricultural statistical data are well correlated (r(2) = 0.85). The merit and uniqueness of the CIIWS method is the ability to cope with the complex intra-class variability through continuous wavelet transform and efficient feature extraction based on wavelet isolines. As an objective and meaningful algorithm, it guarantees easy applications and greatly contributes to satellite observations of vegetation dynamics and food security efforts. (C) 2016 Elsevier B.V. All rights reserved.
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COMPUTERS AND ELECTRONICS IN AGRICULTURE
ISSN: 0168-1699
Year: 2016
Volume: 125
Page: 1-11
2 . 2 0 1
JCR@2016
7 . 7 0 0
JCR@2023
ESI Discipline: COMPUTER SCIENCE;
ESI HC Threshold:175
JCR Journal Grade:1
CAS Journal Grade:2
Cited Count:
WoS CC Cited Count: 12
SCOPUS Cited Count: 16
ESI Highly Cited Papers on the List: 0 Unfold All
WanFang Cited Count:
Chinese Cited Count:
30 Days PV: 2
Affiliated Colleges: