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author:

Lai, Huan Sheng (Lai, Huan Sheng.) [1] | Yoon, Kee Bong (Yoon, Kee Bong.) [2]

Indexed by:

EI Scopus SCIE

Abstract:

Functionally graded materials (FGMs) are increasingly being used in high-temperature structural components. The time-dependent C-integral, C(t), is a significant parameter in characterizing the crack tip stress field from the small-scale to the extensive steady-state creep stages. In this paper, the creep crack behavior of FGMs with a crack parallel to the material property gradients was studied by using the finite element method. It was proven that C(t) remained valid for FGMs. An engineering method was proposed to estimate C(t) in the small scale and transition creep stages and estimate the crack tip stress field. Finite element results verified that the method could estimate C(t) in the small scale and transition creep stages and estimate the crack tip stress field. For cases with creep properties that increased in the crack growth direction, the effect of constraint on the estimated crack tip stress field had to be considered. The constraint parameter of Q was significantly affected by the creep property gradients. The method was independent of the gradient variation law of material properties. (C) 2016 Elsevier Ltd. All rights reserved.

Keyword:

C* Crack tip stress C(t) FGM Functionally graded material

Community:

  • [ 1 ] [Lai, Huan Sheng]Chung Ang Univ, Dept Mech Engn, 221 Huksuk Dongjak, Seoul 156756, South Korea
  • [ 2 ] [Yoon, Kee Bong]Chung Ang Univ, Dept Mech Engn, 221 Huksuk Dongjak, Seoul 156756, South Korea
  • [ 3 ] [Lai, Huan Sheng]Fuzhou Univ, Sch Chem Engn, Fuzhou 350116, Fujian, Peoples R China

Reprint 's Address:

  • 赖焕生

    [Lai, Huan Sheng]Fuzhou Univ, Sch Chem Engn, Fuzhou 350116, Fujian, Peoples R China

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Source :

COMPOSITE STRUCTURES

ISSN: 0263-8223

Year: 2016

Volume: 153

Page: 728-737

3 . 8 5 8

JCR@2016

6 . 3 0 0

JCR@2023

ESI Discipline: MATERIALS SCIENCE;

ESI HC Threshold:324

JCR Journal Grade:1

CAS Journal Grade:2

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 9

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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