In　an　optical　voltage　sensor　(OVS)　based　on　Pockels　effect,　there　are　some　inevitable　issues　in　its　practical　applications,　such　as　vibration　effects,　aging　connections　between　optical　elements,　hot　expansion　and　cold　contraction　of　the　elements,　and　so　on.　These　issues　can　cause　a　deviation　between　the　optical　elements,　which　affects　the　internal　electric　field　distributions　in　the　electro-optic　crystal.　In　this　paper,　the　electric　field　of　a　multi-segmented　Pockels　OVS　is　analyzed,　and　the　result　shows　when　the　incident　angle　or　the　position　of　the　crystal　has　a　small　deviation,　the　integral　voltage　error　is　more　than　0.2%,　which　makes　it　impossible　to　accurately　meet　measuring　accuracy.　In　order　to　improve　the　electric　field　distributions,　a　new　method　of　quartz　crystal　(QC)　stratification　is　presented　and　verified　by　simulation　analysis　and　experiments.　The　optimized　structure　constructed　by　the　new　method　can　reduce　the　electric　field　integral　error　caused　by　optical　path　deviation　from　0.1971%　to　0.0498%　and　errors　caused　by　crystal　deviation　from　0.2759%　to　0.0098%,　thus　making　it　easier　to　meet　the　requirement　of　0.2%　accuracy　class　(IEC　60044-7-1999).