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author:

Chen, Kun-Long (Chen, Kun-Long.) [1] | Huang, Guan-Jie (Huang, Guan-Jie.) [2] | Chen, Nanming (Chen, Nanming.) [3] | Lee, Wei-Jen (Lee, Wei-Jen.) [4]

Indexed by:

EI Scopus SCIE

Abstract:

Compared with traditional current transformers (CTs), electronic current transformers (ECT) have the following advantages: (1) no saturation problem, (2) wider measurement range, (3) smaller footprint, (4) lighter weight, and (5) easier for digitization. Hence, the ECT is one of the critical components in the development of intelligent substations. Since the majority of the sensing elements of ECTs are semiconductor materials, their accuracy and sensitivity are influenced by the ambient temperature. Moreover, the quiescent output voltage of the semiconductor-based ECT is also affected by the ambient temperature. This paper proposes a self-calibration method with the ability of quiescent-output-voltage compensation and sensitivity compensation. The proposed design can automatically adjust the quiescent output voltage and the sensitivity variation when the temperature changes. The experimental test results demonstrate that an ECT with the proposed self-calibration method can achieve Class 0.5 for measuring CTs and Class 5P20 for protective CTs.

Keyword:

current measurement Current transformer intelligent substation thermal drift

Community:

  • [ 1 ] [Chen, Kun-Long]Fuzhou Univ, Coll Elect Engn & Automat, Fuzhou, Fujian, Peoples R China
  • [ 2 ] [Huang, Guan-Jie]Natl Taiwan Univ Sci & Technol, Dept Elect Engn, Taipei, Taiwan
  • [ 3 ] [Chen, Nanming]Natl Taiwan Univ Sci & Technol, Dept Elect Engn, Taipei, Taiwan
  • [ 4 ] [Lee, Wei-Jen]Univ Texas Arlington, Energy Syst Res Ctr, Arlington, TX 76019 USA

Reprint 's Address:

  • 陈坤隆

    [Chen, Kun-Long]Fuzhou Univ, Coll Elect Engn & Automat, Fuzhou, Fujian, Peoples R China

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Source :

JOURNAL OF THE CHINESE INSTITUTE OF ENGINEERS

ISSN: 0253-3839

Year: 2018

Issue: 2

Volume: 41

Page: 77-85

0 . 6 5 1

JCR@2018

1 . 0 0 0

JCR@2023

ESI Discipline: ENGINEERING;

ESI HC Threshold:170

JCR Journal Grade:4

CAS Journal Grade:4

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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