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author:

Ren, Zhiying (Ren, Zhiying.) [1] (Scholars:任志英) | Gao, Chenghui (Gao, Chenghui.) [2] (Scholars:高诚辉) | Luo, Dehui (Luo, Dehui.) [3] | Gao, Bingpan (Gao, Bingpan.) [4]

Indexed by:

EI Scopus SCIE

Abstract:

To evaluate the intermediate-frequency error of a precision optical surface, a method for more accurate separation and identification of the intermediate-frequency error is proposed. This method is based on the Hilbert spectrum and the instantaneous frequency separation method. Experimental results show that the intermediate-frequency error spectrum can be obtained using the method of instantaneous frequency separation based on the Hilbert spectrum. This method separates only the intermediate-frequency error component (0.03 mm(-1) <= f <= 8.33 mm(-1)). Also, the method accurately identifies the non-qualified component distribution (at sampling points 200, 840, and 1000). Therefore, this algorithm is a useful guide for deterministic processing of optical components. (C) 2018 Society of Photo-Optical Instrumentation Engineers (SPIE)

Keyword:

Hilbert spectrum instantaneous frequency intermediate-frequency error optical components

Community:

  • [ 1 ] [Ren, Zhiying]Fuzhou Univ, Sch Mech Engn & Automat, Fuzhou, Fujian, Peoples R China
  • [ 2 ] [Gao, Chenghui]Fuzhou Univ, Sch Mech Engn & Automat, Fuzhou, Fujian, Peoples R China
  • [ 3 ] [Luo, Dehui]Fuzhou Univ, Sch Mech Engn & Automat, Fuzhou, Fujian, Peoples R China
  • [ 4 ] [Gao, Bingpan]Fuzhou Univ, Sch Mech Engn & Automat, Fuzhou, Fujian, Peoples R China
  • [ 5 ] [Ren, Zhiying]Fuzhou Univ, Tribol Inst, Fuzhou, Fujian, Peoples R China
  • [ 6 ] [Gao, Chenghui]Fuzhou Univ, Tribol Inst, Fuzhou, Fujian, Peoples R China

Reprint 's Address:

  • 任志英

    [Ren, Zhiying]Fuzhou Univ, Sch Mech Engn & Automat, Fuzhou, Fujian, Peoples R China;;[Ren, Zhiying]Fuzhou Univ, Tribol Inst, Fuzhou, Fujian, Peoples R China

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Source :

OPTICAL ENGINEERING

ISSN: 0091-3286

Year: 2018

Issue: 6

Volume: 57

1 . 2 0 9

JCR@2018

1 . 1 0 0

JCR@2023

ESI Discipline: ENGINEERING;

ESI HC Threshold:170

JCR Journal Grade:3

CAS Journal Grade:4

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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