• Complex
  • Title
  • Keyword
  • Abstract
  • Scholars
  • Journal
  • ISSN
  • Conference
成果搜索

author:

Chen, Zhicong (Chen, Zhicong.) [1] (Scholars:陈志聪) | Chen, Yixiang (Chen, Yixiang.) [2] | Wu, Lijun (Wu, Lijun.) [3] (Scholars:吴丽君) | Cheng, Shuying (Cheng, Shuying.) [4] (Scholars:程树英) | Lin, Peijie (Lin, Peijie.) [5] (Scholars:林培杰) | You, Linlin (You, Linlin.) [6]

Indexed by:

EI Scopus SCIE

Abstract:

Accurate and reliable modeling of photovoltaic (PV) modules is significant for optimal design, operation and evaluation of PV systems. PV models can be classified into equivalent circuit-based white box models and data-driven black box models. Due to the difficulty to obtain the ground true model parameters and the limitation posed by the predetermined model structure, white-box modeling methods generally suffer relatively low accuracy and generalization performance for arbitrary operating conditions. In addition, reported black-box models are based on the conventional artificial neural networks (ANN) that are efficient but have limited performance. In this study, motivated by the high performance of fast developing deep learning techniques, we propose a novel black-box modeling method for the PV modules using a new modified one-dimensional deep residual network (1-D ResNet) and measured I-V characteristic curves, which can predict a whole I-V curve at a time for arbitrary operating conditions. To alleviate the overfitting issue caused by imbalanced data, original I-V curve datasets with highly non-uniform operating conditions are resampled by a grid sampling approach to obtain the datasets with relatively uniform conditions for the subsequent modeling. The proposed 1-D ResNet based model is comprehensively verified and compared with a proposed single-diode based white-box model and three other conventional ANN based black-box models, using large datasets of measured I-V characteristic curves from the National Renewable Energy Laboratory (NREL). Experimental results indicate that black-box models are generally better than the white-box model. Especially, the proposed 1-D ResNet based PV model is obviously superior to other three conventional ANN based black-box models, in terms of accuracy, generalization performance and reliability.

Keyword:

Black-box modeling Convolutional neural network Deep learning Deep residual network I-V characteristic prediction Photovoltaic modeling

Community:

  • [ 1 ] [Chen, Zhicong]Fuzhou Univ, Coll Phys & Informat Engn, 2 XueYuan Rd, Fuzhou 350116, Fujian, Peoples R China
  • [ 2 ] [Chen, Yixiang]Fuzhou Univ, Coll Phys & Informat Engn, 2 XueYuan Rd, Fuzhou 350116, Fujian, Peoples R China
  • [ 3 ] [Wu, Lijun]Fuzhou Univ, Coll Phys & Informat Engn, 2 XueYuan Rd, Fuzhou 350116, Fujian, Peoples R China
  • [ 4 ] [Cheng, Shuying]Fuzhou Univ, Coll Phys & Informat Engn, 2 XueYuan Rd, Fuzhou 350116, Fujian, Peoples R China
  • [ 5 ] [Lin, Peijie]Fuzhou Univ, Coll Phys & Informat Engn, 2 XueYuan Rd, Fuzhou 350116, Fujian, Peoples R China
  • [ 6 ] [Chen, Zhicong]Jiangsu Collaborat Innovat Ctr Photovolta Sci & E, Changzhou 213164, Peoples R China
  • [ 7 ] [Chen, Yixiang]Jiangsu Collaborat Innovat Ctr Photovolta Sci & E, Changzhou 213164, Peoples R China
  • [ 8 ] [Wu, Lijun]Jiangsu Collaborat Innovat Ctr Photovolta Sci & E, Changzhou 213164, Peoples R China
  • [ 9 ] [Cheng, Shuying]Jiangsu Collaborat Innovat Ctr Photovolta Sci & E, Changzhou 213164, Peoples R China
  • [ 10 ] [Lin, Peijie]Jiangsu Collaborat Innovat Ctr Photovolta Sci & E, Changzhou 213164, Peoples R China
  • [ 11 ] [You, Linlin]Singapore MIT Alliance Res & Technol Ctr, Future Urban Mobil Interdisciplinary Res Grp, 09-02,1 CREATE Way, Singapore 138602, Singapore

Reprint 's Address:

  • 吴丽君 程树英

    [Wu, Lijun]Fuzhou Univ, Coll Phys & Informat Engn, 2 XueYuan Rd, Fuzhou 350116, Fujian, Peoples R China;;[Cheng, Shuying]Fuzhou Univ, Coll Phys & Informat Engn, 2 XueYuan Rd, Fuzhou 350116, Fujian, Peoples R China

Show more details

Related Keywords:

Source :

ENERGY CONVERSION AND MANAGEMENT

ISSN: 0196-8904

Year: 2019

Volume: 186

Page: 168-187

8 . 2 0 8

JCR@2019

9 . 9 0 0

JCR@2023

ESI Discipline: ENGINEERING;

ESI HC Threshold:150

JCR Journal Grade:1

CAS Journal Grade:1

Cited Count:

WoS CC Cited Count: 47

SCOPUS Cited Count: 55

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

Online/Total:223/10021323
Address:FZU Library(No.2 Xuyuan Road, Fuzhou, Fujian, PRC Post Code:350116) Contact Us:0591-22865326
Copyright:FZU Library Technical Support:Beijing Aegean Software Co., Ltd. 闽ICP备05005463号-1