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author:

Gul, Sahar Ramin (Gul, Sahar Ramin.) [1] | Khan, Matiullah (Khan, Matiullah.) [2] | Zeng, Yi (Zeng, Yi.) [3] | Wu, Bo (Wu, Bo.) [4] (Scholars:吴波)

Indexed by:

EI Scopus SCIE

Abstract:

To understand the improved stability and reduced thermal conductivity of 20% CeO2 stabilized ZrO2 coatings compared to pure zirconia, different Ce doped ZrO2 systems are modeled. The Ce insertion in ZrO2 lattice elongates the lattice parameters and the elongation is proportional to the Ce doping concentration. Moreover, the cell volume linearly increases with the Ce doping level. X-ray diffraction analysis confirmed the Zr0.84Ce0.16O2 phase, describing the substitutional Ce doped at Zr sites. Ce doping modified the electronic band structure of ZrO2 without creating any isolated states in the band gap. The Ce4Zr12O32 modeled system with Ce doping concentration of 8.33% provided the stable phonon density of states curves compared to the pure and doped systems. Ce doping reduced the thermal conductivity of ZrO2. Increasing Ce doping level further reduced the thermal conductivity reaching the maximum reduction at 8.33% doping concentration. Further increase in the Ce level has no effective reduction in the thermal conductivity values. The reduced thermal conductivity is attributed to the enhanced phonon scattering due to the substitutional Ce4+ dopant and optimal doping concentration. The experimental observation could be satisfactorily explained by the calculations results.

Keyword:

20% CeO2 stabilized ZrO2 ab-initio calculations thermal barrier coatings thermal conductivity

Community:

  • [ 1 ] [Gul, Sahar Ramin]Fuzhou Univ, Coll Mat Sci & Engn, Multiscale Computat Mat Facil, Fuzhou 350100, Fujian, Peoples R China
  • [ 2 ] [Wu, Bo]Fuzhou Univ, Coll Mat Sci & Engn, Multiscale Computat Mat Facil, Fuzhou 350100, Fujian, Peoples R China
  • [ 3 ] [Gul, Sahar Ramin]Chinese Acad Sci, Shanghai Inst Ceram, State Key Lab High Performance Ceram & Superfine, Shanghai 200050, Peoples R China
  • [ 4 ] [Khan, Matiullah]Chinese Acad Sci, Shanghai Inst Ceram, State Key Lab High Performance Ceram & Superfine, Shanghai 200050, Peoples R China
  • [ 5 ] [Zeng, Yi]Chinese Acad Sci, Shanghai Inst Ceram, State Key Lab High Performance Ceram & Superfine, Shanghai 200050, Peoples R China
  • [ 6 ] [Khan, Matiullah]KUST, Dept Phys, Kohat 26000, Pakistan
  • [ 7 ] [Zeng, Yi]Univ Chinese Acad Sci, Ctr Mat Sci & Optoelect Engn, Beijing 100049, Peoples R China

Reprint 's Address:

  • 吴波

    [Wu, Bo]Fuzhou Univ, Coll Mat Sci & Engn, Multiscale Computat Mat Facil, Fuzhou 350100, Fujian, Peoples R China;;[Khan, Matiullah]Chinese Acad Sci, Shanghai Inst Ceram, State Key Lab High Performance Ceram & Superfine, Shanghai 200050, Peoples R China;;[Zeng, Yi]Chinese Acad Sci, Shanghai Inst Ceram, State Key Lab High Performance Ceram & Superfine, Shanghai 200050, Peoples R China;;[Khan, Matiullah]KUST, Dept Phys, Kohat 26000, Pakistan;;[Zeng, Yi]Univ Chinese Acad Sci, Ctr Mat Sci & Optoelect Engn, Beijing 100049, Peoples R China

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Source :

MATERIALS RESEARCH EXPRESS

ISSN: 2053-1591

Year: 2019

Issue: 7

Volume: 6

1 . 9 2 9

JCR@2019

1 . 8 0 0

JCR@2023

ESI Discipline: MATERIALS SCIENCE;

ESI HC Threshold:236

CAS Journal Grade:4

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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