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author:

Su, Shijian (Su, Shijian.) [1] | Dai, Houde (Dai, Houde.) [2] | Cheng, Shuying (Cheng, Shuying.) [3] (Scholars:程树英) | Lin, Peijie (Lin, Peijie.) [4] (Scholars:林培杰) | Hu, Chao (Hu, Chao.) [5] | Lv, Bowen (Lv, Bowen.) [6]

Indexed by:

EI Scopus SCIE

Abstract:

Magnetic tracking approach (MTA) is mainly based on the observation of the magnetic field produced by a magnetic tracking target. A permanent magnet is usually employed as the tracking target, and a magnetic dipole model is used to estimate the magnetic field. In this article, we introduce an intuitive method to solve the magnetic tracking problem based on graph optimization. A graph is constructed to formulate the tracking problem, whose nodes correspond to the poses of the permanent magnet at different times and whose edges represent constraints derived by sensor measurements. The accuracy and robustness of MTA play a vital role in biomedical and industrial applications. However, a potential abnormal edge will appear in the graph when a magnetic sensor is disturbed by an interference source like a small magnet, which will deteriorate the localization accuracy of MTA. To improve its robustness, Huber cost function is used to reduce the weight of the abnormal edge. Finally, experiments were carried out to verify the performance of the proposed approach with and without magnetic field interference. Comparing the localization errors with the MTA based on the standard Levenberg-Marquardt algorithm, the results illustrate that the proposed approach could achieve superior localization accuracy and anti-interference ability.

Keyword:

Anti-interference Cost function factor graph graph optimization Huber cost function Magnetic field measurement Magnetic fields Magnetic sensors magnetic tracking approach (MTA) Magnetometers Target tracking

Community:

  • [ 1 ] [Su, Shijian]Fuzhou Univ, Inst Micronano Devices & Solar Cells, Coll Phys & Informat Engn, Fuzhou 350108, Peoples R China
  • [ 2 ] [Cheng, Shuying]Fuzhou Univ, Inst Micronano Devices & Solar Cells, Coll Phys & Informat Engn, Fuzhou 350108, Peoples R China
  • [ 3 ] [Lin, Peijie]Fuzhou Univ, Inst Micronano Devices & Solar Cells, Coll Phys & Informat Engn, Fuzhou 350108, Peoples R China
  • [ 4 ] [Su, Shijian]Chinese Acad Sci, Haixi Inst, Quanzhou Inst Equipment Mfg, Jinjiang 362200, Peoples R China
  • [ 5 ] [Dai, Houde]Chinese Acad Sci, Haixi Inst, Quanzhou Inst Equipment Mfg, Jinjiang 362200, Peoples R China
  • [ 6 ] [Lv, Bowen]Chinese Acad Sci, Haixi Inst, Quanzhou Inst Equipment Mfg, Jinjiang 362200, Peoples R China
  • [ 7 ] [Hu, Chao]Zhejiang Univ, Ningbo Inst Technol, Ningbo 315100, Peoples R China

Reprint 's Address:

  • 程树英

    [Cheng, Shuying]Fuzhou Univ, Inst Micronano Devices & Solar Cells, Coll Phys & Informat Engn, Fuzhou 350108, Peoples R China

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Related Keywords:

Source :

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT

ISSN: 0018-9456

Year: 2020

Issue: 10

Volume: 69

Page: 7933-7940

4 . 0 1 6

JCR@2020

5 . 6 0 0

JCR@2023

ESI Discipline: ENGINEERING;

ESI HC Threshold:132

JCR Journal Grade:1

CAS Journal Grade:2

Cited Count:

WoS CC Cited Count: 22

SCOPUS Cited Count: 15

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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