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author:

Xu, Jie (Xu, Jie.) [1] | Huang, Jing (Huang, Jing.) [2] | Wang, Huaiyuan (Wang, Huaiyuan.) [3] (Scholars:王怀远)

Indexed by:

Scopus SCIE

Abstract:

Recently, data-driven methods have been widely assessed by researchers in the field of power system transient stability assessment (TSA). The differences in prediction difficulty among the samples are ignored by most previous studies. To address this problem, anchor loss (AL) is introduced, which can dynamically reshape loss values based on the prediction difficulty of samples. Thereby, easy samples are suppressed by reducing their loss values to avoid being paid too much attention when they are misclassified. Meanwhile, hard samples are emphasized by increasing their loss values, in order to be predicted correctly as much as possible. On basis of the AL, historical information in the model training process is considered. A novel loss function named historical information anchor loss (HIAL) is designed. The loss values can be adaptively rescaled according to the previous prediction results as well as the prediction difficulty of samples. Finally, the HIAL is combined with the deep brief network (DBN) and applied in the IEEE 39-bus system, and a realistic system is produced to verify its effectiveness. By incorporating prediction difficulty and historical training information, the accuracy (with a reduction in misjudgment rate exceeding 30%) and convergence speed of the TSA model can be significantly improved.

Keyword:

anchor loss deep belief network historical training information prediction difficulty transient stability assessment

Community:

  • [ 1 ] [Xu, Jie]Fujian Univ Technol, Sch Elect Elect & Phys, Fuzhou 350000, Peoples R China
  • [ 2 ] [Huang, Jing]Fujian Univ Technol, Sch Elect Elect & Phys, Fuzhou 350000, Peoples R China
  • [ 3 ] [Wang, Huaiyuan]Fuzhou Univ, Coll Elect Engn & Automat, Fuzhou 350000, Peoples R China

Reprint 's Address:

  • [Wang, Huaiyuan]Fuzhou Univ, Coll Elect Engn & Automat, Fuzhou 350000, Peoples R China;;

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Source :

ELECTRONICS

ISSN: 2079-9292

Year: 2025

Issue: 1

Volume: 14

2 . 6 0 0

JCR@2023

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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